TY - CONF AU - Wardzińska Agnieszka AU - Bandurski Wojciech JO - European Conference on Circuit Theory and Design TI - VLSI low loss InterConnect scattering parametres T2 - European Conference on Circuit Theory and Design PY - 2011 Y1 - 29-31 August 2011 JA - European Conference on Circuit Theory and Design DO - ER -