Publication
Krzysztof Wegner, Olgierd Stankiewicz, Marek Domański,
Fast View Synthesis through Depth Simplification,
ISO/IEC JTC 1/SC 29/WG 11, M34298, Sapporo, Japan, 7-11 July 2014,
Full textEndNoteCitation
Fast View Synthesis through Depth Simplification,
ISO/IEC JTC 1/SC 29/WG 11, M34298, Sapporo, Japan, 7-11 July 2014,
Full textEndNoteCitation